Share Email Print

Proceedings Paper

Repeatable mask metrology for next-generation lithography tools
Author(s): Steve L. Hentschel; Henry H. Kamberian; Julius Kovatch
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Recent advances in pattern placement accuracy by photomask lithography tools are requiring much tighter repeatability specifications from the metrology equipment used in the characterization and monitoring process of these reticle writing systems. As pattern positioning accuracy specifications for the next generation tools (i.e., MEBES 4500 and ALTA 3000) dip below the 40 nanometer mark, the metrology tool must maintain a pattern placement measurement precision four times smaller than the writing tool, or less than 10 nanometers to satisfy current industry standards. The newest line width and coordinate registration metrology tool from Nikon, the Laser XY-5i, can measure photomasks and reticles with sub-10 nanometer precision. Recent acceptance test results as well as long term stability data (2-4 months) from a tool in a production environment prove the XY-5i worthy to characterize and monitor the newest mask and reticle lithography tools. A road map for future improvements and specification reduction will show the XY-5i capable of meeting the industry's metrology needs well into the 0.25 micron device generation and beyond.

Paper Details

Date Published: 8 December 1995
PDF: 9 pages
Proc. SPIE 2621, 15th Annual BACUS Symposium on Photomask Technology and Management, (8 December 1995); doi: 10.1117/12.228170
Show Author Affiliations
Steve L. Hentschel, Nikon Precision Inc. (United States)
Henry H. Kamberian, Rockwell Telecommunications (United States)
Julius Kovatch, Rockwell Telecommunications (United States)

Published in SPIE Proceedings Vol. 2621:
15th Annual BACUS Symposium on Photomask Technology and Management
Gilbert V. Shelden; James N. Wiley, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?