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Proceedings Paper

Measurements of x-ray reflectivities of Au-coatings at several energies
Author(s): Allan Hornstrup; Finn Erland Christensen; Jorgen Garnaes; Ellen Jespersen; Shou-Hua Zhu; Herbert W. Schnopper
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Paper Abstract

We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show, that two of three examined versions of a density variation model are able to explain the data. We fmd a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We fmd no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils, in the range 6 keV to 12 keV.

Paper Details

Date Published: 1 November 1990
PDF: 12 pages
Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22811
Show Author Affiliations
Allan Hornstrup, Danish Space Research Institute (Denmark)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Jorgen Garnaes, Danish Space Research Institute (United States)
Ellen Jespersen, Danish Space Research Institute (Denmark)
Shou-Hua Zhu, Danish Space Research Institute (China)
Herbert W. Schnopper, Danish Space Research Institute (United States)

Published in SPIE Proceedings Vol. 1333:
Advanced Optical Manufacturing and Testing
Gregory M. Sanger; Paul B. Reid; Lionel R. Baker, Editor(s)

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