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Proceedings Paper

A method for the determination of defect density from standard damage frequency measurements
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Paper Abstract

This paper presents a method to make an estimation of the low fluence edge of the defect distribution, ρ(φ), from data collected from ISO 21254 standard damage frequency measurements. The cumulative probability of damage is formulated and the defect distribution is formulated as an expansion of an orthonormal set. This formulation allows the explicit isolation of the terms pertaining to the defect distribution and the intensity distribution. When the intensity distribution is specified, the resulting system is a polynomial in nature. Solutions for the systems relevant for Gaussian and are presented.

Paper Details

Date Published: 13 November 2017
PDF: 10 pages
Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471R (13 November 2017);
Show Author Affiliations
Jonathan W. Arenberg, Northrop Grumman Aerospace Systems (United States)
Carmen Menoni, Colorado State Univ. (United States)

Published in SPIE Proceedings Vol. 10447:
Laser-Induced Damage in Optical Materials 2017
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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