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Proceedings Paper • Open Access

Nanosecond multiple pulse measurements and the different types of defects

Paper Abstract

Laser damage measurements with multiple pulses at constant fluence (S-on-1 measurements) are of high practical importance for design and validation of high power photonic instruments. Using nanosecond lasers, it has been recognized long ago that single pulse laser damage is linked to fabrication related defects. Models describing the laser damage probability as the probability of encounter between the high fluence region of the laser beam and the fabrication related defects are thus widely used to analyze the measurements. Nanosecond S-on-1 tests often reveal the “fatigue effect”, i.e. a decrease of the laser damage threshold with increasing pulse number. Most authors attribute this effect to cumulative material modifications operated by the first pulses. In this paper we discuss the different situations that are observed upon nanosecond S-on-1 measurements of several different materials using different wavelengths and speak in particular about the defects involved in the laser damage mechanism. These defects may be fabrication-related or laser-induced, stable or evolutive, cumulative or of short lifetime. We will show that the type of defect that is dominating an S-on-1 experiment depends on the wavelength and the material under test and give examples from measurements of nonlinear optical crystals, fused silica and oxide mixture coatings.

Paper Details

Date Published: 13 November 2017
PDF: 11 pages
Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 1044719 (13 November 2017); doi: 10.1117/12.2280521
Show Author Affiliations
Frank R. Wagner, Aix Marseille Univ., Institut Fresnel, CNRS (France)
Jean-Yves Natoli, Aix Marseille Univ., Institut Fresnel, CNRS (France)
Alexandre Beaudier, Aix Marseille Univ., Institut Fresnel, CNRS (France)
Mireille Commandré, Aix Marseille Univ., Institut Fresnel, CNRS (France)

Published in SPIE Proceedings Vol. 10447:
Laser-Induced Damage in Optical Materials 2017
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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