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Proceedings Paper

Stylus profilometry of large optics
Author(s): William J. Wills-Moren; Peter B. Leadbeater
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Paper Abstract

There is a critical need for new metrology tools for bridging the gap between mechani cal profilometry and high-resolution Interterometry in the manufacture of advanced optical components. A new class of instruments is becoming available because of the rapid advances In laser diode technology. Properties of modern index-guIded laser diodes include wavelength tunability, multiple wavelength operation, excellent spatial coherence and low unit cost. These properties can be used for absolute distance measurement on polished and unpolished optical surfaces during fabrication.

Paper Details

Date Published: 1 November 1990
PDF: 12 pages
Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); doi: 10.1117/12.22803
Show Author Affiliations
William J. Wills-Moren, Cranfield Precision Engineering Ltd. (United Kingdom)
Peter B. Leadbeater, Cranfield Precision Engineering Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 1333:
Advanced Optical Manufacturing and Testing
Gregory M. Sanger; Paul B. Reid; Lionel R. Baker, Editor(s)

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