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Proceedings Paper

Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry
Author(s): Yi Zhou; Yan Tang; Qinyuan Deng; Lixin Zhao; Song Hu
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Paper Abstract

Three-dimensional measurement and inspection is an area with growing needs and interests in many domains, such as integrated circuits (IC), medical cure, and chemistry. Among the methods, broadband light interferometry is widely utilized due to its large measurement range, noncontact and high precision. In this paper, we propose a spatial modulation depth-based method to retrieve the surface topography through analyzing the characteristics of both frequency and spatial domains in the interferogram. Due to the characteristics of spatial modulation depth, the technique could effectively suppress the negative influences caused by light fluctuations and external disturbance. Both theory and experiments are elaborated to confirm that the proposed method can greatly improve the measurement stability and sensitivity with high precision. This technique can achieve a superior robustness with the potential to be applied in online topography measurement.

Paper Details

Date Published: 23 August 2017
PDF: 7 pages
Proc. SPIE 10373, Applied Optical Metrology II, 103730G (23 August 2017);
Show Author Affiliations
Yi Zhou, Institute of Optics and Electronics, Chinese Academy of Sciences (China)
Univ. of Chinese Academy of Sciences (China)
Yan Tang, Institute of Optics and Electronics, Chinese Academy of Sciences (China)
Qinyuan Deng, Institute of Optics and Electronics, Chinese Academy of Sciences (China)
Univ. of Chinese Academy of Sciences (China)
Lixin Zhao, Institute of Optics and Electronics, Chinese Academy of Sciences (China)
Song Hu, Institute of Optics and Electronics, Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 10373:
Applied Optical Metrology II
Erik Novak; James D. Trolinger, Editor(s)

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