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Proceedings Paper

Third order optical nonlinearity investigation of germanium quantum dots embedded in silica matrix
Author(s): Liangmin Zhang; David Bishel; Joseph Mini Jr.; William Cheung; Salvador Montes; Fei Gao
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Paper Abstract

Multilayered germanium nanocrystals embedded in silica (SiO2) matrices are fabricated by using the radio frequency magnetron co-sputtering technique. Transmission electron microscopy shows germanium (Ge) nanocrystals are confined in the (Ge+SiO2) layers in the silica thin films. Linear optical absorption coefficients at different wavelengths and the energy gap of the films are calculated based on absorbance measurement data. Photoluminescence emission property is also characterized. Using the open aperture z-scan technique, we have also measured nonlinear absorption and computed the imaginary part of third-order optical susceptibility of these samples.

Paper Details

Date Published: 28 August 2017
PDF: 7 pages
Proc. SPIE 10344, Nanophotonic Materials XIV, 103440L (28 August 2017); doi: 10.1117/12.2279889
Show Author Affiliations
Liangmin Zhang, California State Univ., Stanislaus (United States)
David Bishel, California State Univ., Stanislaus (United States)
Joseph Mini Jr., California State Univ., Stanislaus (United States)
William Cheung, California State Univ., Stanislaus (United States)
Salvador Montes, California State Univ., Stanislaus (United States)
Fei Gao, Shaanxi Normal Univ. (China)

Published in SPIE Proceedings Vol. 10344:
Nanophotonic Materials XIV
Stefano Cabrini; Gilles Lérondel; Adam M. Schwartzberg; Taleb Mokari, Editor(s)

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