Share Email Print

Proceedings Paper

Computer aided manufacturing for complex freeform optics
Author(s): Franciscus Wolfs; Ed Fess; Dustin Johns; Gabriel LePage; Greg Matthews
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Recently, the desire to use freeform optics has been increasing. Freeform optics can be used to expand the capabilities of optical systems and reduce the number of optics needed in an assembly. The traits that increase optical performance also present challenges in manufacturing. As tolerances on freeform optics become more stringent, it is necessary to continue to improve methods for how the grinding and polishing processes interact with metrology.

To create these complex shapes, OptiPro has developed a computer aided manufacturing package called PROSurf. PROSurf generates tool paths required for grinding and polishing freeform optics with multiple axes of motion. It also uses metrology feedback for deterministic corrections. ProSurf handles 2 key aspects of the manufacturing process that most other CAM systems struggle with. The first is having the ability to support several input types (equations, CAD models, point clouds) and still be able to create a uniform high-density surface map useable for generating a smooth tool path. The second is to improve the accuracy of mapping a metrology file to the part surface. To perform this OptiPro is using 3D error maps instead of traditional 2D maps. The metrology error map drives the tool path adjustment applied during processing. For grinding, the error map adjusts the tool position to compensate for repeatable system error. For polishing, the error map drives the relative dwell times of the tool across the part surface. This paper will present the challenges associated with these issues and solutions that we have created.

Paper Details

Date Published: 16 October 2017
PDF: 9 pages
Proc. SPIE 10448, Optifab 2017, 1044815 (16 October 2017); doi: 10.1117/12.2279794
Show Author Affiliations
Franciscus Wolfs, OptiPro Systems (United States)
Ed Fess, OptiPro Systems (United States)
Dustin Johns, OptiPro Systems (United States)
Gabriel LePage, OptiPro Systems (United States)
Greg Matthews, OptiPro Systems (United States)

Published in SPIE Proceedings Vol. 10448:
Optifab 2017
Julie L. Bentley; Sebastian Stoebenau, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?