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Proceedings Paper

Present status of metrology of electro-optical surveillance systems
Author(s): K. Chrzanowski
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Paper Abstract

There has been a significant progress in equipment for testing electro-optical surveillance systems over the last decade. Modern test systems are increasingly computerized, employ advanced image processing and offer software support in measurement process. However, one great challenge, in form of relative low accuracy, still remains not solved. It is quite common that different test stations, when testing the same device, produce different results. It can even happen that two testing teams, while working on the same test station, with the same tested device, produce different results. Rapid growth of electro-optical technology, poor standardization, limited metrology infrastructure, subjective nature of some measurements, fundamental limitations from laws of physics, tendering rules and advances in artificial intelligence are major factors responsible for such situation. Regardless, next decade should bring significant improvements, since improvement in measurement accuracy is needed to sustain fast growth of electro-optical surveillance technology.

Paper Details

Date Published: 6 October 2017
PDF: 8 pages
Proc. SPIE 10433, Electro-Optical and Infrared Systems: Technology and Applications XIV, 104330W (6 October 2017);
Show Author Affiliations
K. Chrzanowski, Wojskowa Akademia Techniczna im. Jaroslawa Dabrowskiego (Poland)

Published in SPIE Proceedings Vol. 10433:
Electro-Optical and Infrared Systems: Technology and Applications XIV
David A. Huckridge; Reinhard Ebert; Helge Bürsing, Editor(s)

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