We demonstrate the voltage induced switching of single defect centers between its charge states. The individual charge states do show different emission wavelengths and are identified by their ground state spin properties.

Date Published: 26 June 2017
PDF: 3 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032906 (26 June 2017); doi: 10.1117/12.2278897

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)