Share Email Print

Proceedings Paper

Super-resolution depth information from a short-wave infrared laser gated-viewing system by using correlated double sampling
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Primarily, a laser gated-viewing (GV) system provides range-gated 2D images without any range resolution within the range gate. By combining two GV images with slightly different gate positions, 3D information within a part of the range gate can be obtained. The depth resolution is higher (super-resolution) than the minimal gate shift step size in a tomographic sequence of the scene. For a state-of-the-art system with a typical frame rate of 20 Hz, the time difference between the two required GV images is 50 ms which may be too long in a dynamic scenario with moving objects.

Therefore, we have applied this approach to the reset and signal level images of a new short-wave infrared (SWIR) GV camera whose read-out integrated circuit supports correlated double sampling (CDS) actually intended for the reduction of kTC noise (reset noise). These images are extracted from only one single laser pulse with a marginal time difference in between.

The SWIR GV camera consists of 640 x 512 avalanche photodiodes based on mercury cadmium telluride with a pixel pitch of 15 μm. A Q-switched, flash lamp pumped solid-state laser with 1.57 μm wavelength (OPO), 52 mJ pulse energy after beam shaping, 7 ns pulse length and 20 Hz pulse repetition frequency is used for flash illumination.

In this paper, the experimental set-up is described and the operating principle of CDS is explained. The method of deriving super-resolution depth information from a GV system by using CDS is introduced and optimized. Further, the range accuracy is estimated from measured image data.

Paper Details

Date Published: 5 October 2017
PDF: 10 pages
Proc. SPIE 10434, Electro-Optical Remote Sensing XI, 104340M (5 October 2017); doi: 10.1117/12.2278431
Show Author Affiliations
Benjamin Göhler, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)
Peter Lutzmann, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

Published in SPIE Proceedings Vol. 10434:
Electro-Optical Remote Sensing XI
Gary Kamerman; Ove Steinvall, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?