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Proceedings Paper

Principle and analysis of a rotational motion Fourier transform infrared spectrometer
Author(s): Qisheng Cai; Huang Min; Wei Han; Yixuan Liu; Lulu Qian; Xiangning Lu
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Paper Abstract

Fourier transform infrared spectroscopy is an important technique in studying molecular energy levels, analyzing material compositions, and environmental pollutants detection. A novel rotational motion Fourier transform infrared spectrometer with high stability and ultra-rapid scanning characteristics is proposed in this paper. The basic principle, the optical path difference (OPD) calculations, and some tolerance analysis are elaborated. The OPD of this spectrometer is obtained by the continuously rotational motion of a pair of parallel mirrors instead of the translational motion in traditional Michelson interferometer. Because of the rotational motion, it avoids the tilt problems occurred in the translational motion Michelson interferometer. There is a cosine function relationship between the OPD and the rotating angle of the parallel mirrors. An optical model is setup in non-sequential mode of the ZEMAX software, and the interferogram of a monochromatic light is simulated using ray tracing method. The simulated interferogram is consistent with the theoretically calculated interferogram. As the rotating mirrors are the only moving elements in this spectrometer, the parallelism of the rotating mirrors and the vibration during the scan are analyzed. The vibration of the parallel mirrors is the main error during the rotation. This high stability and ultra-rapid scanning Fourier transform infrared spectrometer is a suitable candidate for airborne and space-borne remote sensing spectrometer.

Paper Details

Date Published: 5 September 2017
PDF: 7 pages
Proc. SPIE 10402, Earth Observing Systems XXII, 104022P (5 September 2017); doi: 10.1117/12.2276977
Show Author Affiliations
Qisheng Cai, Academy of Opto-Electronics (China)
Huang Min, Academy of Opto-Electronics (China)
Wei Han, Academy of Opto-Electronics (China)
Yixuan Liu, Academy of Opto-Electronics (China)
Lulu Qian, Academy of Opto-Electronics (China)
Xiangning Lu, Academy of Opto-Electronics (China)

Published in SPIE Proceedings Vol. 10402:
Earth Observing Systems XXII
James J. Butler; Xiaoxiong (Jack) Xiong; Xingfa Gu, Editor(s)

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