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Proceedings Paper

Cs2LiCeCl6: An intrinsic scintillator for dual gamma and neutron detector applications (Conference Presentation)

Paper Abstract

Intrinsic materials can offer advantages over doped materials for some important applications. The doped material might suffer from non-uniform distribution of the dopant, such as fine-scale striations and larger scale segregation, which might affect the overall device response, especially for large-volume detectors such as those in demand for homeland security applications for gamma spectroscopy. Cs2LiCeCl6 (CLCC), being an intrinsic scintillator, can be grown in large volume to produce large detectors with good performance, provided the crystals are free from unwanted scattering centers. CLCC belongs to the elpasolite family and the structure is cubic, so large-volume ingots can be grown without the strains resulting from anisotropic thermal expansion coefficients. In this presentation, we will discuss extensive material characterization and device response of CLCC for gamma and thermal neutron detector applications.

Paper Details

Date Published: 18 October 2017
Proc. SPIE 10392, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX, 103920O (18 October 2017); doi: 10.1117/12.2276956
Show Author Affiliations
Utpal N. Roy, Brookhaven National Lab. (United States)
Giuseppe S. Camarda, Brookhaven National Lab. (United States)
Yonggang Cui, Brookhaven National Lab. (United States)
Rubi Gul, Brookhaven National Lab. (United States)
Anwar Hossain, Brookhaven National Lab (United States)
Ge Yang, Brookhaven National Lab. (United States)
Ralph B. James, Savannah River National Lab. (United States)
Steven L. Hunter, Lawrence Livermore National Lab. (United States)
Patrick R. Beck, Lawrence Livermore National Lab. (United States)
Nerine J. Cherepy, Lawrence Livermore National Lab. (United States)
Stephen A. Payne, Lawrence Livermore National Lab. (United States)

Published in SPIE Proceedings Vol. 10392:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX
Arnold Burger; Ralph B. James; Michael Fiederle; Larry Franks; Stephen A. Payne, Editor(s)

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