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Proceedings Paper

High-energy radiography of dense material with high flux Inverse-Compton x-ray source (Conference Presentation)
Author(s): Shouyuan Chen; Ping Zhang; Grigory Golovin; Baozhen Zhao; Colton Fruhling; Daniel Haden; Wenchao Yan; Cheng Liu; Sudeep Banerjee; Cameron Miller; Shaun Clarke; Sara Pozzi; Donald P. Umstadter

Paper Abstract

We report the high energy radiography of dense material using MeV all-optical-driven inverse Compton x-ray source. The properties of the inverse-Compton x-ray source are controlled by means of electron energy, electron charge, scattering beam focal spot size and pulse duration to obtain optimized x-ray energy and high flux for dense material radiography. In this experiment, the x-ray has a photon energy of 8 MeV for maximal steel penetration depth, and a flux of 1011 x-ray photons per shot. With this novel x-ray source, we are able to demonstrate radiography of a 10 cm thick “kite” object through a steel shielding with thickness up to 40 cm in a single exposure. The radiography image of the “kite” object though the 40 cm steel has signal to noise ratio of 2 and image contrast of 0.1, and the “kite” object can be clearly distinguished in the image. Combining its tunability, ultrafast pulse duration and micron meter resolution, the all-optical-driven inverse Compton x-ray source provides unique capacities for flash radiography of dense material, and is of interest for ultrafast nuclear physics study.

Paper Details

Date Published: 19 September 2017
Proc. SPIE 10387, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI, 103870C (19 September 2017); doi: 10.1117/12.2276736
Show Author Affiliations
Shouyuan Chen, Univ. of Nebraska-Lincoln (United States)
Ping Zhang, Univ. of Nebraska-Lincoln (United States)
Grigory Golovin, Univ. of Nebraska-Lincoln (United States)
Baozhen Zhao, Univ. of Nebraska-Lincoln (United States)
Colton Fruhling, Univ. of Nebraska-Lincoln (United States)
Daniel Haden, Univ. of Nebraska-Lincoln (United States)
Wenchao Yan, Univ. of Nebraska-Lincoln (United States)
Cheng Liu, Univ. of Nebraska-Lincoln (United States)
Sudeep Banerjee, Univ. of Nebraska-Lincoln (United States)
Cameron Miller, Univ. of Michigan (United States)
Shaun Clarke, Univ. of Michigan (United States)
Sara Pozzi, Univ. of Michigan (United States)
Donald P. Umstadter, Univ. of Nebraska-Lincoln (United States)

Published in SPIE Proceedings Vol. 10387:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI
Ali M. Khounsary; Giovanni Pareschi, Editor(s)

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