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Proceedings Paper

White light spectral interferometer for measuring dispersion in the visible-near infrared
Author(s): Yago Arosa; Carlos Damian Rodríguez Fernández; Bilal S. Algnamat; Elena López-Lago; Raul de la Fuente
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Paper Abstract

We have designed a spectrally resolved interferometer to measure the refractive index of transparent samples over a wide spectral band from 400 to 1550 nm. The measuring device consists of a Michelson interferometer whose output is analyzed by means of three fiber spectrometers. The first one is a homemade prism spectrometer, which obtains the interferogram produced by the sample over 400 to 1050 nm; the second one is a homemade transmission grating spectrometer thought to measure the interferogram in the near infrared spectral band from 950 to 1550 nm; the last one is a commercial Czerny-Turner spectrometer used to make high precision measurements of the displacement between the Michelson mirrors also using white light interferometry. The whole system is illuminated by a white light source with an emission spectrum similar to black body. We have tested the instrument with solid and liquids samples achieving accuracy to the fourth decimal on the refractive index after fitting it to a Cauchy formula

Paper Details

Date Published: 22 August 2017
PDF: 6 pages
Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 104532R (22 August 2017);
Show Author Affiliations
Yago Arosa, Univ. de Santiago de Compostela (Spain)
Carlos Damian Rodríguez Fernández, Univ. de Santiago de Compostela (Spain)
Bilal S. Algnamat, Univ. de Santiago de Compostela (Spain)
Elena López-Lago, Univ. de Santiago de Compostela (Spain)
Raul de la Fuente, Univ. de Santiago de Compostela (Spain)

Published in SPIE Proceedings Vol. 10453:
Third International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

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