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Proceedings Paper

Image blurring due to turbulent wakes for airborne systems: flight tests
Author(s): Stanislav Gordeyev; Nicholas De Lucca; Yakov Diskin; Eric J. Jumper; Matthew R. Whiteley
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Paper Abstract

Image blurring and resolution degradation due to aero-optical effects around a hemispherical turret were studied experimentally in-flight using AAOL-T program at subsonic and transonic speeds. A target board consisted of spoke patterns and three-bar groups with various sizes was used to quantify the image blurring. Aero-optical effects and related image blurring were measured simultaneously using synchronized high-speed cameras. Instantaneous wavefronts were used to compute point-spread functions and modulation transfer functions. It was demonstrated that point-spread functions were mostly axisymmetric over a wide range of viewing angles and could be faithfully approximated by the Gaussian ones. Image degradation was found to primarily dependent on the overall level of aero-optical distortions, expressed in waves, and less on spatial statistical properties of the wavefronts. Simulations of image resolution degradation using realistic aero-optical wavefront spectrum were shown to agree with experimentally-obtained results. Presented results and analysis provide means of estimating the image resolution degradation from statistics of the nearfield aero-optical distortions.

Paper Details

Date Published: 30 August 2017
PDF: 16 pages
Proc. SPIE 10408, Laser Communication and Propagation through the Atmosphere and Oceans VI, 104080M (30 August 2017); doi: 10.1117/12.2275632
Show Author Affiliations
Stanislav Gordeyev, Univ. of Notre Dame (United States)
Nicholas De Lucca, Univ. of Notre Dame (United States)
Yakov Diskin, MZA Associates Corp. (United States)
Eric J. Jumper, Univ. of Notre Dame (United States)
Matthew R. Whiteley, MZA Associates Corp. (United States)

Published in SPIE Proceedings Vol. 10408:
Laser Communication and Propagation through the Atmosphere and Oceans VI
Jeremy P. Bos; Alexander M. J. van Eijk; Stephen M. Hammel, Editor(s)

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