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Proceedings Paper

Effect of light irradiation and forward bias during PID tests of CIGS PV modules
Author(s): Keiichiro Sakurai; Hiroshi Tomita; Kinichi Ogawa; Darshan Schmitz; Hajime Shibata; Shuuji Tokuda; Atsushi Masuda
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Paper Abstract

We have conducted potential induced degradation (PID) tests on CIGS photovoltaic (PV) modules with/without LED white light irradiation. Suppression of PID degradation was observed by light irradiation.

Paper Details

Date Published: 23 August 2017
PDF: 3 pages
Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X, 103700C (23 August 2017); doi: 10.1117/12.2275348
Show Author Affiliations
Keiichiro Sakurai, National Institute of Advanced Industrial Science and Technology (Japan)
Hiroshi Tomita, Solar Frontier K.K. (Japan)
Kinichi Ogawa, National Institute of Advanced Industrial Science and Technology (Japan)
Darshan Schmitz, Solar Frontier K.K. (Japan)
Hajime Shibata, National Institute of Advanced Industrial Science and Technology (Japan)
Shuuji Tokuda, Solar Frontier K.K. (Japan)
Atsushi Masuda, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 10370:
Reliability of Photovoltaic Cells, Modules, Components, and Systems X
Neelkanth G. Dhere; Keiichiro Sakurai; Michael D. Kempe, Editor(s)

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