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Proceedings Paper

Phase-shifting projected fringe profilometry using ternary-encoded patterns
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Paper Abstract

A fringe projection profilometry is presented. It uses the phase-shifting technique perform the phase-extraction and use the ternary-encoded patterns to identify the fringe orders. Only five-shot measurements are required for data processing. Experiments show that absolute phases could be obtained with high reliability.

Paper Details

Date Published: 23 August 2017
PDF: 7 pages
Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820U (23 August 2017); doi: 10.1117/12.2275325
Show Author Affiliations
Sih-Yue Chen, National Sun Yat-Sen Univ. (Taiwan)
Nai-Jen Cheng, National Kaohsiung Univ. of Applied Sciences (Taiwan)
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 10382:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
Shizhuo Yin; Ruyan Guo, Editor(s)

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