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Proceedings Paper

Integrated confocal Raman probe combined with a free-form reflector based lab-on-chip
Author(s): Qing Liu; Giancarlo Barbieri; Hugo Thienpont; Heidi Ottevaere
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Paper Abstract

Raman spectroscopy is a powerful tool for analytical measurements in many applications. Traditional Raman spectroscopic analyses require bulky equipment, considerable time of signal acquisition and manual sampling of substances under test. In this paper, we take a step from bulky and manual consuming laboratory testing towards lab-on-chip (LOC) analyses. We miniaturize the Raman spectroscopic system by combining a free-form reflector based polymer LOC with a customized Raman probe. By using the confocal detection principle, we aim to enhance the detection of the Raman signals from the substance of interest due to the suppression of the background Raman signal from the polymer of the chip. Next to the LOC we miniaturize the external optical components, surrounding the reflector embedding optofluidic chip, and assemble these in a Raman probe. We evaluate the misalignment tolerance of internal optics (LOC) and external optics (Raman probe) by non-sequential ray tracing which shows that off-axis misalignment is around ±400μm and the maximum working distance of our Raman probe is 71mm. Using this probe, the system could be implemented as a portable reader unit containing the external optics, in which a low-cost, robust and mass manufacturable microfluidic LOC containing a freeform reflector is inserted, to enable confocal Raman spectroscopy measurements.

Paper Details

Date Published: 24 August 2017
PDF: 9 pages
Proc. SPIE 10377, Optical System Alignment, Tolerancing, and Verification XI, 1037706 (24 August 2017);
Show Author Affiliations
Qing Liu, Vrije Univ. Brussel (Belgium)
Giancarlo Barbieri, Vrije Univ. Brussel (Belgium)
Hugo Thienpont, Vrije Univ. Brussel (Belgium)
Flanders Make (Belgium)
Heidi Ottevaere, Vrije Univ. Brussel (Belgium)
Flanders Make (Belgium)

Published in SPIE Proceedings Vol. 10377:
Optical System Alignment, Tolerancing, and Verification XI
José Sasián; Richard N. Youngworth, Editor(s)

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