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Proceedings Paper

Interscale mixing microscopy: far field imaging beyond the diffraction limit (Conference Presentation)
Author(s): Viktor A. Podolskiy; Christopher M. Roberts; Nicolas Olivier; William P. Wardley; Bo Fan; Sandeep Inampudi; Wayne Dickson; Anatoly V. Zayats

Paper Abstract

Optical characterization of subwavelength objects is important for biology, nanotechnology, chemistry, and materials science. Unfortunately, the information about interaction of an isolated subwavelength object with light is contained in evanescent waves that exponentially decay away from the source. Numerous techniques have been proposed to access or restore this information. In interscale mixing microscopy (IMM), a diffraction grating positioned in the near field proximity of the object is used to convert the originally-evanescent waves into propagating modes that can be detected with far-field measurements. However, far-field signal needs to be post-processed to un-couple the diffraction-limited and subwavelength responses. Several techniques, based on multiple measurements, have been previously proposed. Here, we show that with simple Fourier-transform based post processing can be used to characterize position, and optical size of the object based on a single measurement. To verify the proposed formalism, three finite diffraction gratings were fabricated. Two of these gratings contained pre-engineered “defects” that played the role of “unknown objects”, while the remaining grating was used as a reference. We demonstrate that we can identify the position and size of ~wavelength/10 object with far-field characterization. The same measurement provides a platform to analyze optical spectrum of the object. Although demonstrated in this work on example of 1D grating, IMM can be extended to 2D subwavelength imaging

Paper Details

Date Published: 18 October 2017
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Proc. SPIE 10343, Metamaterials, Metadevices, and Metasystems 2017, 1034322 (18 October 2017); doi: 10.1117/12.2274934
Show Author Affiliations
Viktor A. Podolskiy, Univ. of Massachusetts Lowell (United States)
Christopher M. Roberts, Univ. of Massachusetts Lowell (United States)
Nicolas Olivier, King's College London (United Kingdom)
William P. Wardley, King's College London (United Kingdom)
Bo Fan, Univ. of Massachusetts Lowell (United States)
Sandeep Inampudi, Univ. of Massachusetts Lowell (United States)
Northeastern Univ. (United States)
Wayne Dickson, King's College London (United Kingdom)
Anatoly V. Zayats, King's College London (United Kingdom)


Published in SPIE Proceedings Vol. 10343:
Metamaterials, Metadevices, and Metasystems 2017
Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)

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