Share Email Print

Proceedings Paper

Fizeau stitching at the European Synchrotron Radiation Facility (ESRF)
Author(s): Amparo Vivo; Raymond Barrett
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

X-ray mirror figure errors are commonly measured in the synchrotron community using Long Trace Profiler (LTP) or Nanometer Optical measuring Machine (NOM) instruments, both providing 2D slope measurement. 3D reconstruction is possible but time consuming, and requires a high stability of environmental conditions over long periods which is not easy to achieve. Characterisation of the complete topography of the mirror surface is essential for the application of deterministic figure correction techniques and also to reveal undesired stresses or deformations, such as twist, introduced by optomechanical mounting. At the ESRF metrology laboratory Fizeau stitching methods are under development. A full automated mechanical setup dedicated to stitching measurement of long flat mirrors is now operational. We have previously demonstrated accurate reconstruction by stitching 2D profiles acquired from Fizeau subaperture measurements. This work is focused on 3D reconstruction of flat mirror surfaces up to one meter long. Repeatability, accuracy and in particular the influence of the transmission element will be discussed.

Paper Details

Date Published: 7 September 2017
PDF: 9 pages
Proc. SPIE 10385, Advances in Metrology for X-Ray and EUV Optics VII, 103850N (7 September 2017); doi: 10.1117/12.2274745
Show Author Affiliations
Amparo Vivo, ESRF - The European Synchrotron (France)
Raymond Barrett, ESRF - The European Synchrotron (France)

Published in SPIE Proceedings Vol. 10385:
Advances in Metrology for X-Ray and EUV Optics VII
Lahsen Assoufid; Haruhiko Ohashi; Anand Krishna Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top