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Proceedings Paper

Characterization of PDMS samples with variation of its synthesis parameters for tunable optics applications
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Paper Abstract

Nowadays the elastomer known as polydimethylsiloxane (PDMS, Sylgard 184), due to its physical properties, low cost and easy handle, have become a frequently used material for the elaboration of optical components such as: variable focal length liquid lenses, optical waveguides, solid elastic lenses, etc. In recent years, we have been working in the characterization of this material for applications in visual sciences; in this work, we describe the elaboration of PDMSmade samples, also, we present physical and optical properties of the samples by varying its synthesis parameters such as base: curing agent ratio, and both, curing time and temperature. In the case of mechanical properties, tensile and compression tests were carried out through a universal testing machine to obtain the respective stress-strain curves, and to obtain information regarding its optical properties, UV-vis spectroscopy is applied to the samples to obtain transmittance and absorbance curves. Index of refraction variation was obtained through an Abbe refractometer. Results from the characterization will determine the proper synthesis parameters for the elaboration of tunable refractive surfaces for potential applications in robotics.

Paper Details

Date Published: 5 September 2017
PDF: 6 pages
Proc. SPIE 10372, Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems III, 1037205 (5 September 2017); doi: 10.1117/12.2274638
Show Author Affiliations
Josimar Marquez-Garcia, Univ. Tecnológica de la Mixteca (Mexico)
Angel S. Cruz-Félix, Univ. Tecnológica de la Mixteca (Mexico)
Agustin Santiago-Alvarado, Univ. Tecnológica de la Mixteca (Mexico)
Jorge González-García, Univ. Tecnológica de la Mixteca (Mexico)

Published in SPIE Proceedings Vol. 10372:
Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems III
Matthias Krödel; Joseph L. Robichaud; Bill A. Goodman, Editor(s)

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