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Proceedings Paper

Improving material identification by combining x-ray and neutron tomography
Author(s): Jacob M. LaManna; Daniel S. Hussey; Eli Baltic; David L. Jacobson
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Paper Abstract

X-rays and neutrons provide complementary non-destructive probes for the analysis of structure and chemical composition of materials. Contrast differences between the modes arise due to the differences in interaction with matter. Due to the high sensitivity to hydrogen, neutrons excel at separating liquid water or hydrogenous phases from the underlying structure while X-rays resolve the solid structure. Many samples of interest, such as fluid flow in porous materials or curing concrete, are stochastic or slowly changing with time which makes analysis of sequential imaging with X-rays and neutrons difficult as the sample may change between scans. To alleviate this issue, NIST has developed a system for simultaneous X-ray and neutron tomography by orienting a 90 keVpeak micro-focus X-ray tube orthogonally to a thermal neutron beam. This system allows for non-destructive, multimodal tomography of dynamic or stochastic samples while penetrating through sample environment equipment such as pressure and flow vessels. Current efforts are underway to develop methods for 2D histogram based segmentation of reconstructed volumes. By leveraging the contrast differences between X-rays and neutrons, greater histogram peak separation can occur in 2D vs 1D enabling improved material identification.

Paper Details

Date Published: 25 September 2017
PDF: 7 pages
Proc. SPIE 10391, Developments in X-Ray Tomography XI, 1039104 (25 September 2017); doi: 10.1117/12.2274443
Show Author Affiliations
Jacob M. LaManna, National Institute of Standards and Technology (United States)
Daniel S. Hussey, National Institute of Standards and Technology (United States)
Eli Baltic, National Institute of Standards and Technology (United States)
David L. Jacobson, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 10391:
Developments in X-Ray Tomography XI
Bert Müller; Ge Wang, Editor(s)

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