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Proceedings Paper

Degradation of photovoltaic backsheet materials under multi-factor accelerated UV light exposures
Author(s): Addison G. Klinke; Abdulkerim Gok; Silas I. Ifeanyi; Roger H. French; Laura S. Bruckman
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Paper Abstract

Long term outdoor durability of photovoltaic (PV) module backsheets is critical to a module's power output over its lifetime. The use of uoropolymer-based backsheets or the addition of stabilizers to polyethylene-terephthalate (PET) and polyamide (PA) type backsheets can help extend their lifetime. This study presents the performance of 21 backsheets made of 8 different material combinations under ASTM G154 Cycle 4 accelerated light exposures. The backsheets were subjected to 4000 hours of high irradiance UVA light at a peak intensity of 1.55 W=m2 at 340 nm at 70°C with and without a condensing humidity cycle at 50°C. Backsheets were evaluated, with repeated measurements, using various evaluation techniques to identify and assess potential signs of degradation. These evaluations included the yellowness index (YI), CIE color space coordinates, and gloss at 20, 60, and 85°. The temporal evolution of the relative color change ΔE was statistically analyzed to develop a stress-response model which used the UVA light dose to predict color change. It was found that the PVF/PET/E backsheet performed the best while PET/PET/E and THV/PET/EVA backsheets performed the worst. Additionally, substantial variation in color change response, attributable to key manufacturing differences, was observed within a given material type.

Paper Details

Date Published: 23 August 2017
PDF: 8 pages
Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X, 1037004 (23 August 2017); doi: 10.1117/12.2274108
Show Author Affiliations
Addison G. Klinke, Case Western Reserve Univ. (United States)
Abdulkerim Gok, Gebze Technical Univ. (Turkey)
Silas I. Ifeanyi, Case Western Reserve Univ. (United States)
Roger H. French, Case Western Reserve Univ. (United States)
Laura S. Bruckman, Case Western Reserve Univ. (United States)

Published in SPIE Proceedings Vol. 10370:
Reliability of Photovoltaic Cells, Modules, Components, and Systems X
Neelkanth G. Dhere; Keiichiro Sakurai; Michael D. Kempe, Editor(s)

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