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Proceedings Paper

Single-grating Talbot imaging for wavefront sensing and x-ray metrology
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Paper Abstract

Single-grating Talbot imaging relies on high-spatial-resolution detectors to perform accurate measurements of X-ray beam wavefronts. The wavefront can be retrieved with a single image, and a typical measurement and data analysis can be performed in few seconds. These qualities make it an ideal tool for synchrotron beamline diagnostics and in-situ metrology. The wavefront measurement can be used both to obtain a phase contrast image of an object and to characterize an X-ray beam. In this work, we explore the concept in two cases: at-wavelength metrology of 2D parabolic beryllium lenses and a wavefront sensor using a diamond crystal beam splitter.

Paper Details

Date Published: 7 September 2017
PDF: 8 pages
Proc. SPIE 10385, Advances in Metrology for X-Ray and EUV Optics VII, 1038502 (7 September 2017); doi: 10.1117/12.2274023
Show Author Affiliations
Walan Grizolli, Argonne National Lab. (United States)
Xianbo Shi, Argonne National Lab. (United States)
Tomasz Kolodziej, Argonne National Lab. (United States)
Yuri Shvyd'ko, Argonne National Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 10385:
Advances in Metrology for X-Ray and EUV Optics VII
Lahsen Assoufid; Haruhiko Ohashi; Anand Krishna Asundi, Editor(s)

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