
Proceedings Paper
Inverse problem of Bragg's scattering for measuring the spectrum surface roughness in the optical gradient waveguideFormat | Member Price | Non-Member Price |
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Paper Abstract
A new method for measuring the spectrum of surface roughness based on Bragg scattering, is proposed. This method is characterized by its high precision of measurement of the spatial amplitudes and frequencies. Was determined the rang of spatial frequencies (periods) of harmonics in the roughness spectrum surfaces (0,π) (0; π). When the rotation´s angle of grating is (0,π/4) will be a forward scattering or Bragg´s deflector. At rotation´s angle of grating is (π/2,π/4) or (-3π/4,-π/2) will a Bragg´s mirror. The measurements are made in a gradient waveguide, obtained by ion exchange method.
Paper Details
Date Published: 5 September 2017
PDF: 9 pages
Proc. SPIE 10372, Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems III, 1037209 (5 September 2017); doi: 10.1117/12.2273970
Published in SPIE Proceedings Vol. 10372:
Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems III
Matthias Krödel; Joseph L. Robichaud; Bill A. Goodman, Editor(s)
PDF: 9 pages
Proc. SPIE 10372, Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems III, 1037209 (5 September 2017); doi: 10.1117/12.2273970
Show Author Affiliations
N. Grishaeva, Russian Peoples' Friendship Univ. (Russian Federation)
A. Osovitsky, Russian Peoples' Friendship Univ. (Russian Federation)
N. Espinosa, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
A. Osovitsky, Russian Peoples' Friendship Univ. (Russian Federation)
N. Espinosa, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
L. Cadena, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
C. Vega, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
J. Alvarez, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
C. Vega, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
J. Alvarez, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
Published in SPIE Proceedings Vol. 10372:
Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems III
Matthias Krödel; Joseph L. Robichaud; Bill A. Goodman, Editor(s)
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