Share Email Print

Proceedings Paper

Advanced polarization sensitive analysis in optical coherence tomography
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The optical coherence tomography (OCT) is an optical imaging method, which is widely applied in variety applications. This technology is used to cross-sectional or surface imaging with high resolution in non-contact and non-destructive way. OCT is very useful in medical applications like ophthalmology, dermatology or dentistry, as well as beyond biomedical fields like stress mapping in polymers or protective coatings defects detection. Standard OCT imaging is based on intensity images which can visualize the inner structure of scattering devices. However, there is a number of extensions improving the OCT measurement abilities. The main of them are the polarization sensitive OCT (PS-OCT), Doppler enable OCT (D-OCT) or spectroscopic OCT (S-OCT). Our research activities have been focused on PS-OCT systems. The polarization sensitive analysis delivers an useful information about optical anisotropic properties of the evaluated sample. This kind of measurements is very important for inner stress monitoring or e.g. tissue recognition. Based on our research results and knowledge the standard PS-OCT provide only data about birefringence of the measured sample. However, based on the OCT measurements more information including depolarization and diattenuation might be obtained. In our work, the method based on Jones formalism are going to be presented. It is used to determine birefringence, dichroism and optic axis orientation of the tested sample. In this contribution the setup of the optical system, as well as tests results verifying the measurements abilities of the system are going to be presented. The brief discussion about the effectiveness and usefulness of this approach will be carried out.

Paper Details

Date Published: 23 August 2017
PDF: 7 pages
Proc. SPIE 10373, Applied Optical Metrology II, 103730Z (23 August 2017); doi: 10.1117/12.2273962
Show Author Affiliations
Aleksandra Wieloszyńska, Gdansk Univ. of Technology (Poland)
Marcin R. Strąkowski, Gdansk Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 10373:
Applied Optical Metrology II
Erik Novak; James D. Trolinger, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?