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Proceedings Paper

Super-resolved terahertz microscopy by knife-edge scan
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Paper Abstract

We present a compact, all solid-state THz confocal microscope operating at 0.30 THz that achieves super-resolution by using the knife-edge scan approach. In the final reconstructed image, a lateral resolution of 60 μm ≈ λ/17 is demonstrated when the knife-edge is deep in the near-field of the sample surface. When the knife-edge is lifted up to λ/4 from the sample surface, a certain degree of super-resolution is maintained with a resolution of 0.4 mm, i.e. more than a factor 2 if compared to the diffraction-limited scheme. The present results open an interesting path towards super-resolved imaging with in-depth information that would be peculiar to THz microscopy systems.

Paper Details

Date Published: 23 August 2017
PDF: 7 pages
Proc. SPIE 10383, Terahertz Emitters, Receivers, and Applications VIII, 103830P (23 August 2017); doi: 10.1117/12.2273796
Show Author Affiliations
V. Giliberti, Istituto Italiano di Tecnologia (Italy)
M. Flammini, Sapienza Univ. di Roma (Italy)
C. Ciano, Sapienza Univ. di Roma (Italy)
E. Pontecorvo, Crestoptics S.p.A. (Italy)
E. Del Re, Sapienza Univ. di Roma (Italy)
ISC-CNR (Italy)
M. Ortolani, Sapienza Univ. di Roma (Italy)

Published in SPIE Proceedings Vol. 10383:
Terahertz Emitters, Receivers, and Applications VIII
Manijeh Razeghi; Alexei N. Baranov; Dimitris Pavlidis; John M. Zavada, Editor(s)

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