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Proceedings Paper

A Monte Carlo simulation of scattering reduction in spectral x-ray computed tomography
Author(s): Matteo Busi; Ulrik L. Olsen; Erik B. Knudsen; Jeppe R. Frisvad; Jan Kehres; Erik D. Christensen; Mohamad Khalil; Kristoffer Haldrup
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Paper Abstract

In X-ray computed tomography (CT), scattered radiation plays an important role in the accurate reconstruction of the inspected object, leading to a loss of contrast between the different materials in the reconstruction volume and cupping artifacts in the images. We present a Monte Carlo simulation tool for spectral X-ray CT to predict the scattered radiation generated by complex samples. An experimental setup is presented to isolate the energy distribution of scattered radiation. Spectral CT is a novel technique implementing photon-counting detectors able to discriminate the energy of incoming photons, enabling spectral analysis of X-ray images. This technique is useful to extract efficiently more information on energy dependent quantities (e.g. mass attenuations coefficients) and study matter interactions (e.g. X-ray scattering, photoelectric absorption, etc...). Having a good knowledge of the spectral distribution of the scattered X-rays is fundamental to establish methods attempting to correct for it. The simulations are validated by real measurements using a CdTe spectral resolving detector (Multix ME-100). We observed the effect of the scattered radiation on the image reconstruction, becoming relevant in the energy range where the Compton events are dominant (i.e. above 50keV).

Paper Details

Date Published: 23 August 2017
PDF: 9 pages
Proc. SPIE 10388, Advances in Computational Methods for X-Ray Optics IV, 103880P (23 August 2017); doi: 10.1117/12.2273763
Show Author Affiliations
Matteo Busi, Technical Univ. of Denmark (Denmark)
Ulrik L. Olsen, Technical Univ. of Denmark (Denmark)
Erik B. Knudsen, Technical Univ. of Denmark (Denmark)
Jeppe R. Frisvad, Technical Univ. of Denmark (Denmark)
Jan Kehres, Technical Univ. of Denmark (Denmark)
Erik D. Christensen, Niels Bohr Institute (Denmark)
Mohamad Khalil, Technical Univ. of Denmark (Denmark)
Kristoffer Haldrup, Technical Univ. of Denmark (Denmark)

Published in SPIE Proceedings Vol. 10388:
Advances in Computational Methods for X-Ray Optics IV
Oleg Chubar; Kawal Sawhney, Editor(s)

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