Satellite instruments operating in the reflective solar wavelength region require accurate and precise determination of the Bidirectional Reflectance Distribution Functions (BRDFs) of the laboratory and flight diffusers used in their pre-flight and on-orbit calibrations. This paper advances that initial work and presents a comparison of spectral Bidirectional Reflectance Distribution Function (BRDF) and Directional Hemispherical Reflectance (DHR) of Spectralon*, a common material for laboratory and onorbit flight diffusers. A new measurement setup for BRDF measurements from 900 nm to 2500 nm located at NASA Goddard Space Flight Center (GSFC) is described. The GSFC setup employs an extended indium gallium arsenide detector, bandpass filters, and a supercontinuum light source. Comparisons of the GSFC BRDF measurements in the shortwave infrared (SWIR) with those made by the National Institute of Standards and Technology (NIST) Spectral Tri-function Automated Reference Reflectometer (STARR) are presented. The Spectralon sample used in this study was 2 inch diameter, 99% white pressed and sintered Polytetrafluoroethylene (PTFE) target. The NASA/NIST BRDF comparison measurements were made at an incident angle of 0° and viewing angle of 45° . Additional BRDF data not compared to NIST were measured at additional incident and viewing angle geometries and are not presented here. The total combined uncertainty for the measurement of BRDF in the SWIR range made by the GSFC scatterometer is less than 1% (k = 1). This study is in support of the calibration of the Radiation Budget Instrument (RBI) and Visible Infrared Imaging Radiometer Suit (VIIRS) instruments of the Joint Polar Satellite System (JPSS) and other current and future NASA remote sensing missions operating across the reflected solar wavelength region.

Date Published: 5 September 2017
PDF: 11 pages
Proc. SPIE 10402, Earth Observing Systems XXII, 104021N (5 September 2017); doi: 10.1117/12.2273007

Published in SPIE Proceedings Vol. 10402:
Earth Observing Systems XXII
James J. Butler; Xiaoxiong (Jack) Xiong; Xingfa Gu, Editor(s)