We investigate the impact of focused beams on metal-dielectric guided-mode-resonance filters. Under a planewave illumination, these filters show a resonant transmission at an easily tunable wavelength and a good angular acceptance. Although guided-mode resonance is involved, calculations show that under a focused beam the lateral extension of the electromagnetic field inside the waveguide is limited to the width of the beam. We investigate evolution of this lateral extension and the resonant transmission with the size of the beam, as well as the impact of a tilted beam. Guided-mode-resonance filtering under a focused beam is illustrated through the example of a Cassegrain microscope lens. A process for the fabrication of simple metal-dielectric filters is also presented.

Date Published: 31 August 2017
PDF: 8 pages
Proc. SPIE 10354, Nanoengineering: Fabrication, Properties, Optics, and Devices XIV, 1035406 (31 August 2017); doi: 10.1117/12.2273004

Published in SPIE Proceedings Vol. 10354:
Nanoengineering: Fabrication, Properties, Optics, and Devices XIV
Eva M. Campo; Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)