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Proceedings Paper

High-frequency polarization dynamics in spin-lasers: pushing the limits
Author(s): Nils C. Gerhardt; Markus Lindemann; Tobias Pusch; Rainer Michalzik; Martin R. Hofmann
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Paper Abstract

While the high-frequency performance of conventional lasers is limited by the coupled carrier-photon dynamics, spin-polarized lasers have a high potential to overcome this limitation and to push the direct modulation bandwidth beyond 100 GHz. The key is to utilize the ultrafast polarization dynamics in spin-polarized vertical cavity surface-emitting lasers (spin-VCSELs) which is decoupled from the intensity dynamics and its fundamental limitations. The polarization dynamics in such devices, characterized by the polarization oscillation resonance frequency, is mainly determined by the amount of birefringence in the cavity. Using an approach for manipulating the birefringence via mechanical strain we were able to increase the polarization dynamics to resonance frequencies of more than 40 GHz. Up to now these values are only limited by the setup to induce birefringence and do not reflect any fundamental limitations. Taking our record results for the birefringence-induced mode splitting of more than 250 GHz into account, the concept has the potential to provide polarization modulation in spin-VCSELs with modulation frequencies far beyond 100 GHz. This makes them ideal devices for next-generation fast optical interconnects. In this paper we present experimental results for ultrafast polarization dynamics up to 50 GHz and compare them to numerical simulations.

Paper Details

Date Published: 19 September 2017
PDF: 6 pages
Proc. SPIE 10357, Spintronics X, 103572F (19 September 2017); doi: 10.1117/12.2272972
Show Author Affiliations
Nils C. Gerhardt, Ruhr-Univ. Bochum (Germany)
Markus Lindemann, Ruhr-Univ. Bochum (Germany)
Tobias Pusch, Univ. Ulm (Germany)
Rainer Michalzik, Univ. Ulm (Germany)
Martin R. Hofmann, Ruhr-Univ. Bochum (Germany)

Published in SPIE Proceedings Vol. 10357:
Spintronics X
Henri-Jean Drouhin; Jean-Eric Wegrowe; Manijeh Razeghi; Henri Jaffrès, Editor(s)

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