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Proceedings Paper

First x-ray nanoimaging experiments at NanoMAX
Author(s): Ulrich Vogt; Karolis Parfeniukas; Tomaš Stankevič; Sebastian Kalbfleisch; Marianne Liebi; Zdenek Matej; Alexander Björling; Gerardina Carbone; Anders Mikkelsen; Ulf Johansson
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Paper Abstract

NanoMAX is a hard x-ray nanoimaging beamline at the new Swedish synchrotron radiation source MAX IV that became operational in 2016. Being a beamline dedicated to x-ray nanoimaging in both 2D and 3D, NanoMAX is the first to take full advantage of MAX IVs exceptional low emittance and resulting coherent properties. We present results from the first experiments at NanoMAX that took place in December 2016. These did not use the final experimental stations that will become available to users, but a temporary arrangement including zone plate and order-sorting aperture stages and a piezo-driven sample scanner. We used zone plates with outermost zone widths of 100 nm and 30 nm and performed experiments at 8 keV photon energy for x-ray absorption and fluorescence imaging and ptychography. Moreover, we investigated stability and coherence with a Ronchi test method. Despite the rather simple setup, we could demonstrate spatial resolution below 50 nm after only a few hours of beamtime. The results showed that the beamline is working as expected and experiments approaching the 10 nm resolution level or below should be possible in the future.

Paper Details

Date Published: 7 September 2017
PDF: 7 pages
Proc. SPIE 10389, X-Ray Nanoimaging: Instruments and Methods III, 103890K (7 September 2017); doi: 10.1117/12.2272960
Show Author Affiliations
Ulrich Vogt, KTH Royal Institute of Technology (Sweden)
Karolis Parfeniukas, KTH Royal Institute of Technology (Sweden)
Tomaš Stankevič, Max IV Lab. (Sweden)
Sebastian Kalbfleisch, Max IV Lab. (Sweden)
Marianne Liebi, Max IV Lab. (Sweden)
Zdenek Matej, Max IV Lab. (Sweden)
Alexander Björling, Max IV Lab. (Sweden)
Gerardina Carbone, Max IV Lab. (Sweden)
Anders Mikkelsen, Lund Univ. (Sweden)
Ulf Johansson, Max IV Lab. (Sweden)

Published in SPIE Proceedings Vol. 10389:
X-Ray Nanoimaging: Instruments and Methods III
Barry Lai; Andrea Somogyi, Editor(s)

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