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Proceedings Paper

Noise and detectivity of InAs/GaSb T2SL 4.5 um IR detectors
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Paper Abstract

Measurements of low-frequency noise of type-II superlattice detectors designed for mid-IR wavelengths are used to determine noise limitations, calculate the real detectivity, and study 1/f noise-current correlations in these devices. No 1/f noise connected to the diffusion current is found as opposed to the generation-recombination, shunt, and tunneling currents. The contribution from the shunt current to 1/f noise can be so large that shunt-originated noise dominates in the high-temperature region, in which current is limited by the generation-recombination and diffusion components. It is also demonstrated that devices made of type-II superlattice contain traps generating random processes with thermally activated kinetics, and the activation energies of these traps are determined.

Paper Details

Date Published: 30 August 2017
PDF: 10 pages
Proc. SPIE 10404, Infrared Sensors, Devices, and Applications VII, 1040402 (30 August 2017); doi: 10.1117/12.2272722
Show Author Affiliations
Andrzej Kolek, Rzeszów Univ. of Technology (Poland)
Łukasz Ciura, Rzeszów Univ. of Technology (Poland)
Krzysztof Czuba, Institute of Electron Technology (Poland)
Agata Jasik, Institute of Electron Technology (Poland)
Jarosław Jureńczyk, VIGO System S.A. (Poland)
Iwona Sankowska, Institute of Electron Technology (Poland)
Janusz Kaniewski, Institute of Electron Technology (Poland)

Published in SPIE Proceedings Vol. 10404:
Infrared Sensors, Devices, and Applications VII
Paul D. LeVan; Ashok K. Sood; Priyalal Wijewarnasuriya; Arvind I. D'Souza, Editor(s)

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