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Proceedings Paper

Vapor and liquid optical monitoring with sculptured Bragg microcavities
Author(s): Manuel Oliva-Ramirez; Jorge Gil-Rostra; Maria C. López-Santos; Agustín R. González-Elipe; Francisco Yubero
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Paper Abstract

Sculptured porous Bragg Microcavities (BMs) formed by the successive stacking of columnar SiO2 and TiO2 thin films with zig-zag columnar microstructure are prepared by glancing angle deposition. These BMs act as wavelength dependent optical retarders. This optical behavior is attributed to a self-structuration mechanism involving a fence-bundling association of nanocolumns as observed by Focused Ion Beam Scanning Electron Microscopy. The retardance of these optically active BMs can be modulated by dynamic infiltration of their open porosity with vapors, liquids or solutions with different refractive indices. The tunable birefringence of these nanostructured photonic systems have been successfully simulated with a simple model that assumes that each layer within the BMs stack has uniaxial birefringence. This type of self-associated nanostructures has been incorporated to microfluidic chips for free label vapor and liquid sensing. Several examples of the detection performance of these chips, working either in reflection or transmission configuration, for the optical characterization of vapor and liquids of different refractive index and aqueous solutions of glucose flowing through the microfluidic chips are described.

Paper Details

Date Published: 30 August 2017
PDF: 13 pages
Proc. SPIE 10356, Nanostructured Thin Films X, 1035603 (30 August 2017); doi: 10.1117/12.2272411
Show Author Affiliations
Manuel Oliva-Ramirez, Instituto de Ciencia de Materiales de Sevilla (Spain)
Jorge Gil-Rostra, Instituto de Ciencia de Materiales de Sevilla (Spain)
Maria C. López-Santos, Instituto de Ciencia de Materiales de Sevilla (Spain)
Agustín R. González-Elipe, Instituto de Ciencia de Materiales de Sevilla (Spain)
Francisco Yubero, Instituto de Ciencia de Materiales de Sevilla (Spain)

Published in SPIE Proceedings Vol. 10356:
Nanostructured Thin Films X
Yi-Jun Jen; Akhlesh Lakhtakia; Tom G. Mackay, Editor(s)

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