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Proceedings Paper

Estimation of the particle concentration in hydraulic liquid by the in-line automatic particle counter based on the CMOS image sensor
Author(s): Dmitriy V. Kornilin; Ilya A. Kudryavtsev; Alison J. McMillan; Ardeshir Osanlou; Ian Ratcliffe
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Paper Abstract

Modern hydraulic systems should be monitored on the regular basis. One of the most effective ways to address this task is utilizing in-line automatic particle counters (APC) built inside of the system. The measurement of particle concentration in hydraulic liquid by APC is crucial because increasing numbers of particles should mean functional problems. Existing automatic particle counters have significant limitation for the precise measurement of relatively low concentration of particle in aerospace systems or they are unable to measure higher concentration in industrial ones. Both issues can be addressed by implementation of the CMOS image sensor instead of single photodiode used in the most of APC. CMOS image sensor helps to overcome the problem of the errors in volume measurement caused by inequality of particle speed inside of tube. Correction is based on the determination of the particle position and parabolic velocity distribution profile. Proposed algorithms are also suitable for reducing the errors related to the particles matches in measurement volume. The results of simulation show that the accuracy increased up to 90 per cent and the resolution improved ten times more compared to the single photodiode sensor.

Paper Details

Date Published: 26 June 2017
PDF: 10 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103294K (26 June 2017); doi: 10.1117/12.2272059
Show Author Affiliations
Dmitriy V. Kornilin, Samara National Research Univ. (Russian Federation)
Glyndwr Univ. (United Kingdom)
Ilya A. Kudryavtsev, Samara National Research Univ. (Russian Federation)
Alison J. McMillan, Glyndwr Univ. (United Kingdom)
Ardeshir Osanlou, Glyndwr Univ. (United Kingdom)
Ian Ratcliffe, Glyndwr Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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