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Proceedings Paper

Wavemeter improvements for laser diode calibration
Author(s): I. Outumuro; J. Diz-Bugarin; J. L. Valencia; J. Blanco; B. V. Dorrío
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Paper Abstract

This paper shows the progress made in the wavemeter developed to give traceability to the wavelength of lasers and ECDLs (External Cavity Laser Diode). The improvements are: duplication of the optical path of the laser beams due to a double pass through the interferometer arms [1], the electronic fringe counter [2], the measurement of the refractive index of air and the uncertainty calculations of the wavelength for the case of lasers with frequencies that differs more than 10 THz from laser reference. The new measurements improve the previous results [3].

Paper Details

Date Published: 22 August 2017
PDF: 8 pages
Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 1045310 (22 August 2017); doi: 10.1117/12.2272010
Show Author Affiliations
I. Outumuro, Lab. Oficial de Metroloxía de Galicia (Spain)
J. Diz-Bugarin, Univ. of Vigo (Spain)
J. L. Valencia, Lab. Oficial de Metroloxía de Galicia (Spain)
J. Blanco, Univ. of Vigo (Spain)
B. V. Dorrío, Univ. of Vigo (Spain)


Published in SPIE Proceedings Vol. 10453:
Third International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

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