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Proceedings Paper

Comparison of astrophysical laser frequency combs with respect to the requirements of HIRES
Author(s): Jake M. Charsley; Richard A. McCracken; Derryck T. Reid; Grzegorz Kowzan; Piotr Maslowski; Ansgar Reiners; Philipp Huke
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Paper Abstract

Precise astronomical spectroscopy with the forthcoming E-ELT and its high resolution spectrograph HIRES will address a number of important science cases,1 e.g. detection of atmospheres of exoplanets. Challenging technical requirements have been identified to achieve these cases, principal among which is the goal to achieve a radial velocity precision on the order of 10 cms-1. HIRES will experience systematic errors like intrapixel variations and random variations like fiber noise, caused by the non-uniform illumination of the coupling fibers, with these and other systematic errors affecting the performance of the spectrograph. Here, we describe the requirements for the calibration sources which may be used for mitigating such systematic errors in HIRES. Precise wavelength calibration with wide-mode-spacing laser frequency combs (LFCs), so called astrocombs, has been demonstrated with different astronomical spectrographs. Here we present a comparison of currently used astrocombs and outline a possible solution to meet the requirements of HIRES with a single broadband astrocomb.

Paper Details

Date Published: 26 June 2017
PDF: 12 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103290Y (26 June 2017); doi: 10.1117/12.2271846
Show Author Affiliations
Jake M. Charsley, Heriot-Watt Univ. (United Kingdom)
Richard A. McCracken, Heriot-Watt Univ. (United Kingdom)
Derryck T. Reid, Heriot-Watt Univ. (United Kingdom)
Grzegorz Kowzan, Nicolaus Copernicus Univ. (Poland)
Piotr Maslowski, Nicolaus Copernicus Univ. (Poland)
Ansgar Reiners, Georg-August-Univ. Göttingen (Germany)
Philipp Huke, Georg-August-Univ. Göttingen (Germany)

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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