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Proceedings Paper

Vertical Bridgman growth and characterization of Cd0.95-xMnxZn0.05Te (x=0.20, 0.30) single-crystal ingots
Author(s): V. Kopach; O. Kopach; L. Shcherbak; P. Fochuk; Svitlana Filonenko; A. E. Bolotnikov; R. B. James
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Paper Abstract

Solid-liquid phase transitions in Cd0.95-xMnxZn0.05Te alloys with x = 0.20 and 0.30 were investigated by differential thermal analysis (DTA). The heating/cooling rates were 5 and 10 K/min with a melt dwell time of 10, 30 and 60 minutes. Cd0.95-xMnxZn0.05Te (x=0.20, 0.30) single-crystal ingots were grown by the vertical Bridgman method guided by the DTA results.

Te inclusions (1-20 micron diameter), typical of melt-grown CdTe and Cd(Zn)Te crystals, were observed in the ingots by infrared transmission microscopy. The measured X-ray diffraction patterns showed that all compositions are found to be in a single phase. Using current-voltage (I-V) measurements, the resistivity of the samples from each ingot was estimated to be about 105 Ohm·cm. The optical transmission analysis demonstrated that the band-gap of the investigated ingots increased from 1.77 to 1.88 eV with an increase of the MnTe content from 20 to 30 mol. %.

Paper Details

Date Published: 29 August 2017
PDF: 8 pages
Proc. SPIE 10392, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX, 1039214 (29 August 2017); doi: 10.1117/12.2271767
Show Author Affiliations
V. Kopach, Chernivtsi National Univ. (Ukraine)
O. Kopach, Chernivtsi National Univ. (Ukraine)
L. Shcherbak, Chernivtsi National Univ. (Ukraine)
P. Fochuk, Chernivtsi National Univ. (Ukraine)
Svitlana Filonenko, L.V. Pisarzhevskii Institute of Physical Chemistry (Ukraine)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
R. B. James, Savannah River National Lab. (United States)

Published in SPIE Proceedings Vol. 10392:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX
Arnold Burger; Ralph B. James; Michael Fiederle; Larry Franks; Stephen A. Payne, Editor(s)

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