
Proceedings Paper
Improvement of the method of optical testing of fast aspherical surfaces with null-screensFormat | Member Price | Non-Member Price |
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Paper Abstract
We extend the principles of the null-screen method for testing fast aspheric surfaces with polynomial expansion. We
present the formulae to design the null-screen in such a way that the image on the CCD is a perfect array circular points;
the departures of the surface from a perfect shape are observed as deformations of the array in the image. For the testing
of fast aspherics with polynomial expansion, we propose some geometrical configurations. In addition, we perform an
analysis of the deformations of the image of the null-screen reflected by the testing surface due to the slop defects of the
surface. Experimental results for the testing fast aspherics are shown. The main advantages and the limitations of the
method will be discussed.
Paper Details
Date Published: 26 June 2017
PDF: 8 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301V (26 June 2017); doi: 10.1117/12.2271676
Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
PDF: 8 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301V (26 June 2017); doi: 10.1117/12.2271676
Show Author Affiliations
Manuel Campos-García, Univ. Nacional Autónoma de México (Mexico)
Daniel Aguirre Aguirre, Univ. Nacional Autónoma de México (Mexico)
Daniel Aguirre Aguirre, Univ. Nacional Autónoma de México (Mexico)
Victor de Emanuel Armengol-Cruz, Univ. Nacional Autónoma de México (Mexico)
Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
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