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Proceedings Paper

Morphology and optical properties of thin CdTe films
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Paper Abstract

Experimental research in deposition of thin CdTe films was carried out using the resistive dynamic vacuum evaporation method. While forming thin CdTe films, temperature parameters of a substrate varied. Parameters of obtained CdTe films were investigated using Raman spectroscopy, scanning profilometry and scanning electron microscopy. The measured results showed high quality of thin CdTe films deposited on the substrate at temperature of 300°C and 450°C.

Paper Details

Date Published: 6 April 2017
PDF: 9 pages
Proc. SPIE 10342, Optical Technologies for Telecommunications 2016, 103420V (6 April 2017); doi: 10.1117/12.2270758
Show Author Affiliations
V. V. Podlipnov, Samara National Research Univ. (Russian Federation)
Image Processing Systems Institute (Russian Federation)
V. A. Kolpakov, Samara National Research Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 10342:
Optical Technologies for Telecommunications 2016
Vladimir A. Andreev; Anton V. Bourdine; Vladimir A. Burdin; Oleg G. Morozov; Albert H. Sultanov, Editor(s)

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