
Proceedings Paper
Modeling on Bessel beam guide star beacon for wavefront sensingFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Bessel beam has the advantages of reducing scattering artefacts and increasing the quality of the image and penetration.
This paper proposed to generate a guide star by Bessel beam with vortex phase, and to use the beacon with special spot
structure to measure the atmosphere turbulence aberrations. With the matching algorithm of measured characteristic spot
in each subaperture, the detection accuracy of Hartmann wavefront sensor can be improved. Based on wave optics
theory, the modeling of Bessel beam guide star and wavefront sensing system was built. The laser guide star beacon
generated by Bessel beam with vortex phase and beacon echo wave measured by Hartmann sensor were both simulated.
Compared with the results measured by echo wave from Gauss beam generated guide star beacon, this novel method can
reduce the error of wavefront detection and increase the detection accuracy of Hartmann sensor.
Paper Details
Date Published: 26 June 2017
PDF: 6 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301S (26 June 2017); doi: 10.1117/12.2270391
Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
PDF: 6 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301S (26 June 2017); doi: 10.1117/12.2270391
Show Author Affiliations
Quan Sun, National Univ. of Defense Technology (China)
Ruiyao Luo, National Univ. of Defense Technology (China)
Yi Yang, National Univ. of Defense Technology (China)
Ruiyao Luo, National Univ. of Defense Technology (China)
Yi Yang, National Univ. of Defense Technology (China)
Wuming Wu, National Univ. of Defense Technology (China)
Shaojun Du, National Univ. of Defense Technology (China)
Yu Ning, National Univ. of Defense Technology (China)
Shaojun Du, National Univ. of Defense Technology (China)
Yu Ning, National Univ. of Defense Technology (China)
Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
© SPIE. Terms of Use
