Share Email Print

Proceedings Paper

Compensation of optical system distortion and image perspective deformations for the projection lens
Author(s): Anastasiia A. Burtseva; Kseniia V. Ezhova; Oleg V. Trifanov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the article takes up the possibility of optical system distortion compensation for projection lens by making predistortions into projected digital image. Image processing is producing for main types of optical system distortion, which can be described both as power polynomial and as Zernike polynomials.

Special attention is given for perspective deformations which arise in the deviation of the optical axis from perpendicular to the plane of projection. In processing takes into account both as horizontal and as vertical perspective deformation.

For possibility of optical system distortion compensation there is a need to provisional certification of lens by Abbe grid for taking polynomial description of distortion. According to certification results performed image processing on the points corresponding to the nodes of the grid Abbe. As a result of processing a digital image deformations introduced, the reverse occurring when deformations are projecting.

Pre-made image deformations allow to compensate for distortion of optical system and the perspective deformation caused by the projection lens used, therefore, when projecting the image will largely corresponds to the original image. The results of the work is planning to use in the preparation of digital image mapping show, namely the projection on objects of complex geometric shapes.

Paper Details

Date Published: 26 June 2017
PDF: 6 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103294T (26 June 2017); doi: 10.1117/12.2270367
Show Author Affiliations
Anastasiia A. Burtseva, ITMO Univ. (Russian Federation)
Kseniia V. Ezhova, ITMO Univ. (Russian Federation)
Oleg V. Trifanov, ITMO Univ. (Russian Federation)

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?