
Proceedings Paper
Pointwise intensity-based dynamic speckle analysis with binary patternsFormat | Member Price | Non-Member Price |
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Paper Abstract
Non-destructive detection of physical or biological activity through statistical processing of speckle patterns on the
surface of diffusely reflecting objects is an area of active research. A lot of pointwise intensity-based algorithms have
been proposed over the recent years. Efficiency of these algorithms is deteriorated by the signal-dependent speckle data,
non-uniform illumination or varying reflectivity across the object, especially when the number of the acquired speckle
patterns is limited. Pointwise processing of a sequence of 2D images is also time-consuming. In this paper, we propose to
transform the acquired speckle images into binary patterns by using for a sign threshold the mean intensity value
estimated at each spatial point from the temporal sequence of intensities at this point. Activity is characterized by the 2D
distribution of a temporal polar correlation function estimated at a given time lag from the binary patterns. Processing of
synthetic and experimental data confirmed that the algorithm provided correct activity determination with the same
accuracy as the temporal normalized correlation function. It is efficient without the necessity to apply normalization at
non-uniform distribution of intensity in the illuminating laser beam and offers acceleration of computation.
Paper Details
Date Published: 26 June 2017
PDF: 7 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103293Y (26 June 2017); doi: 10.1117/12.2270153
Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
PDF: 7 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103293Y (26 June 2017); doi: 10.1117/12.2270153
Show Author Affiliations
Elena Stoykova, Institute of Optical Materials and Technologies (Bulgaria)
Korea Electronics Technology Institute (Korea, Republic of)
Georgy Mateev, Institute of Optical Materials and Technologies (Bulgaria)
Dimana Nazarova, Institute of Optical Materials and Technologies (Bulgaria)
Korea Electronics Technology Institute (Korea, Republic of)
Georgy Mateev, Institute of Optical Materials and Technologies (Bulgaria)
Dimana Nazarova, Institute of Optical Materials and Technologies (Bulgaria)
Nataliya Berberova, Institute of Optical Materials and Technologies (Bulgaria)
Branimir Ivanov, Institute of Optical Materials and Technologies (Bulgaria)
Branimir Ivanov, Institute of Optical Materials and Technologies (Bulgaria)
Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
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