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Proceedings Paper

Phase imaging using a single-pixel camera
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Paper Abstract

We demonstrate a phase imaging method based on a single-pixel camera based on a complex-amplitude representation to measure a surface profile of objects. The use of the complex-amplitude representation of the input signal and the phaseshifting technique enables us to perform the phase imaging of an object, that is, the profilometry. The complex-amplitude mask can directly represent the Hadamard patterns that have the positive and negative values. The complex-amplitude masks are displayed on phase modulation mode liquid crystal on silicon spatial light modulator (LCOS-SLM). Furthermore, the residual area is used for the reference beam with the phase shifting. Therefore, the phase imaging system with the coaxial structure has high stability for external disturbances.

Paper Details

Date Published: 26 June 2017
PDF: 5 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032907 (26 June 2017); doi: 10.1117/12.2270074
Show Author Affiliations
Yoshio Hayasaki, Utsunomiya Univ. (Japan)
Kazuki Ota, Utsunomiya Univ. (Japan)


Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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