We demonstrate a phase imaging method based on a single-pixel camera based on a complex-amplitude representation to measure a surface profile of objects. The use of the complex-amplitude representation of the input signal and the phaseshifting technique enables us to perform the phase imaging of an object, that is, the profilometry. The complex-amplitude mask can directly represent the Hadamard patterns that have the positive and negative values. The complex-amplitude masks are displayed on phase modulation mode liquid crystal on silicon spatial light modulator (LCOS-SLM). Furthermore, the residual area is used for the reference beam with the phase shifting. Therefore, the phase imaging system with the coaxial structure has high stability for external disturbances.

Date Published: 26 June 2017
PDF: 5 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032907 (26 June 2017); doi: 10.1117/12.2270074

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)