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Proceedings Paper

Application of identifying transmission spheres for spherical surface testing
Author(s): Christopher B. Han; Xin Ye; Xueyuan Li; Quanzhao Wang; Shouhong Tang; Sen Han
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Paper Abstract

We developed a new application on Microsoft Foundation Classes (MFC) to identify correct transmission spheres (TS) for Spherical Surface Testing (SST). Spherical surfaces are important optical surfaces, and the wide application and high production rate of spherical surfaces necessitates an accurate and highly reliable measuring device. A Fizeau Interferometer is an appropriate tool for SST due to its subnanometer accuracy. It measures the contour of a spherical surface using a common path, which is insensitive to the surrounding circumstances. The Fizeau Interferometer transmits a wide laser beam, creating interference fringes from re-converging light from the transmission sphere and the test surface. To make a successful measurement, the application calculates and determines the appropriate transmission sphere for the test surface. There are 3 main inputs from the test surfaces that are utilized to determine the optimal sizes and F-numbers of the transmission spheres: (1) the curvatures (concave or convex), (2) the Radii of Curvature (ROC), and (3) the aperture sizes. The application will firstly calculate the F-numbers (i.e. ROC divided by aperture) of the test surface, secondly determine the correct aperture size of a convex surface, thirdly verify that the ROC of the test surface must be shorter than the reference surface’s ROC of the transmission sphere, and lastly calculate the percentage of area that the test surface will be measured. However, the amount of interferometers and transmission spheres should be optimized when measuring large spherical surfaces to avoid requiring a large amount of interferometers and transmission spheres for each test surface. Current measuring practices involve tedious and potentially inaccurate calculations. This smart application eliminates human calculation errors, optimizes the selection of transmission spheres (including the least number required) and interferometer sizes, and increases efficiency.

Paper Details

Date Published: 26 June 2017
PDF: 5 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103293K (26 June 2017); doi: 10.1117/12.2269979
Show Author Affiliations
Christopher B. Han, Suzhou Singapore International School (China)
Suzhou H&L Instruments LLC (China)
Xin Ye, Univ. of Shanghai for Science and Technology (China)
Suzhou H&L Instruments LLC (China)
Xueyuan Li, Suzhou H&L Instruments LLC (China)
Quanzhao Wang, Suzhou W&N Instruments LLC (China)
Shouhong Tang, Univ. of Shanghai for Science and Technology (China)
Suzhou H&L Intstruments LLC (China)
Sen Han, Univ. of Shanghai for Science and Technology (China)
Suzhou H&L Instruments LLC (China)

Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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