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Proceedings Paper

Interferometric imaging of acoustical phenomena using high-speed polarization camera and 4-step parallel phase-shifting technique
Author(s): K. Ishikawa; K. Yatabe; Y. Ikeda; Y. Oikawa; T. Onuma; H. Niwa; M. Yoshii
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Paper Abstract

Imaging of sound aids the understanding of the acoustical phenomena such as propagation, reflection, and diffraction, which is strongly required for various acoustical applications. The imaging of sound is commonly done by using a microphone array, whereas optical methods have recently been interested due to its contactless nature. The optical measurement of sound utilizes the phase modulation of light caused by sound. Since light propagated through a sound field changes its phase as proportional to the sound pressure, optical phase measurement technique can be used for the sound measurement. Several methods including laser Doppler vibrometry and Schlieren method have been proposed for that purpose. However, the sensitivities of the methods become lower as a frequency of sound decreases. In contrast, since the sensitivities of the phase-shifting technique do not depend on the frequencies of sounds, that technique is suitable for the imaging of sounds in the low-frequency range. The principle of imaging of sound using parallel phase-shifting interferometry was reported by the authors (K. Ishikawa et al., Optics Express, 2016). The measurement system consists of a high-speed polarization camera made by Photron Ltd., and a polarization interferometer. This paper reviews the principle briefly and demonstrates the high-speed imaging of acoustical phenomena. The results suggest that the proposed system can be applied to various industrial problems in acoustical engineering.

Paper Details

Date Published: 20 February 2017
PDF: 7 pages
Proc. SPIE 10328, Selected Papers from the 31st International Congress on High-Speed Imaging and Photonics, 103280I (20 February 2017); doi: 10.1117/12.2269940
Show Author Affiliations
K. Ishikawa, Waseda Univ. (Japan)
K. Yatabe, Waseda Univ. (Japan)
Y. Ikeda, Waseda Univ. (Japan)
Y. Oikawa, Waseda Univ. (Japan)
T. Onuma, Photron Ltd. (Japan)
H. Niwa, Photron Ltd. (Japan)
M. Yoshii, Kiyohara Optics Inc. (Japan)

Published in SPIE Proceedings Vol. 10328:
Selected Papers from the 31st International Congress on High-Speed Imaging and Photonics
T. Goji Etoh; Hiroyuki Shiraga, Editor(s)

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