
Proceedings Paper
Phase retrieval with tunable phase transfer function based on the transport of intensity equationFormat | Member Price | Non-Member Price |
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Paper Abstract
Recovering phase information with Deterministic approaches as the Transport of Intensity Equation (TIE) has recently
emerged as an alternative tool to the interferometric techniques because it is experimentally easy to implement and
provides fast and accurate results. Moreover, the potential of employing partially coherent illumination (PCI) in such
techniques allow obtaining high quality phase reconstructions providing that the estimation of the corresponding Phase
Transfer Function (PTF) is carried out correctly. Hence, accurate estimation of the PTF requires that the physical
properties of the optical system are well known. Typically, these parameters are assumed constant in all the set of
measurements, which might not be optimal. In this work, we proposed the use of an amplitude Spatial Light Modulator
(aSLM) for tuning the degree of coherence of the optical system. The aSLM will be placed at the Fourier plane of the
optical system, and then, band pass filters will be displayed. This methodology will perform amplitude modulation of the
propagated field and as a result, the state of coherence of the optical system can be modified. Theoretical and
experimental results that validate our proposed technique will be shown.
Paper Details
Date Published: 26 June 2017
PDF: 9 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103300D (26 June 2017); doi: 10.1117/12.2269593
Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
PDF: 9 pages
Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103300D (26 June 2017); doi: 10.1117/12.2269593
Show Author Affiliations
J. Martinez-Carranza, Warsaw Univ. of Technology (Poland)
P. Stepien, Warsaw Univ. of Technology (Poland)
P. Stepien, Warsaw Univ. of Technology (Poland)
T. Kozacki, Warsaw Univ. of Technology (Poland)
Published in SPIE Proceedings Vol. 10330:
Modeling Aspects in Optical Metrology VI
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)
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