
Proceedings Paper
Experimental comparison of photogrammetry for additive manufactured parts with and without laser speckle projectionFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper we show that, by using a photogrammetry system with and without laser speckle, a large range of additive
manufacturing (AM) parts with different geometries, materials and post-processing textures can be measured to high
accuracy. AM test artefacts have been produced in three materials: polymer powder bed fusion (nylon-12), metal powder
bed fusion (Ti-6Al-4V) and polymer material extrusion (ABS plastic). Each test artefact was then measured with the
photogrammetry system in both normal and laser speckle projection modes and the resulting point clouds compared with
the artefact CAD model. The results show that laser speckle projection can result in a reduction of the point cloud
standard deviation from the CAD data of up to 101 μm. A complex relationship with surface texture, artefact geometry
and the laser speckle projection is also observed and discussed.
Paper Details
Date Published: 26 June 2017
PDF: 7 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103290W (26 June 2017); doi: 10.1117/12.2269507
Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
PDF: 7 pages
Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103290W (26 June 2017); doi: 10.1117/12.2269507
Show Author Affiliations
D. Sims-Waterhouse, The Univ. of Nottingham (United Kingdom)
P. Bointon, The Univ. of Nottingham (United Kingdom)
P. Bointon, The Univ. of Nottingham (United Kingdom)
S. Piano, The Univ. of Nottingham (United Kingdom)
R. K. Leach, The Univ. of Nottingham (United Kingdom)
R. K. Leach, The Univ. of Nottingham (United Kingdom)
Published in SPIE Proceedings Vol. 10329:
Optical Measurement Systems for Industrial Inspection X
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)
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