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Proceedings Paper

High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications
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Paper Abstract

In this work it is shown that high-intensity microprismatic tapes have a potential to be used as a good substrate for bright and cheap fiducial marks in machine vision metrology applications. The drawback of the tapes is that they have technological netting pattern distributed across the surface. The proposed image processing technique allows good suppression of the parasitic technological netting pattern by a harmonic mean image filtering followed by circle shape recovering based on Fourier descriptors. It was also shown that the combination can provide good results in mark position estimations. In experiments it was shown that subpixel accuracy of position estimation can be achieved after applying proposed image processing, while without filtering the error can exceed 4 pixels in some cases.

Paper Details

Date Published: 26 June 2017
PDF: 7 pages
Proc. SPIE 10334, Automated Visual Inspection and Machine Vision II, 103340G (26 June 2017); doi: 10.1117/12.2269426
Show Author Affiliations
Anna V. Trushkina, ITMO Univ. (Russian Federation)
Aleksandr S. Vasilev, ITMO Univ. (Russian Federation)
Mariya G. Serikova, ITMO Univ. (Russian Federation)
Optical-Electronic Devices, LLC (Russian Federation)
Andrei G. Anisimov, Technische Univ. Delft (Netherlands)

Published in SPIE Proceedings Vol. 10334:
Automated Visual Inspection and Machine Vision II
Jürgen Beyerer; Fernando Puente León, Editor(s)

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